Reference Projects

Equipped with power supplies, digital multimeters and an industrial PC with LIN interface this test station is integrated in the automated production line. It can take over IBS multiboards from a conveyor, run the test sequence then flashing the MCU's memory then forward the workpieces on the next conveyor.

The system software is built in NI LabView and TestStand featuring multithreaded, optimised hardware control of the integrated apparatus, including fixture automation functions.

The depleting algorithm can handle each cell independently by setting up different depletion current and time steps depending on a user defined test recipe. The test can take from minutes to weeks and will record the cell voltage and current flow for every channel.

The test system is controlled by a built in computer running an NI LabView based software featuring a complex graphical user interface for composing test recipes and displaying test result.

These cable harnesses were made using different wire diameters and coating materials depending on the signal properties they carrying on. The wires are connected to carefully chosen industrial standard connectors. Based on client requirements they can be adapted to various connections.

The first station purpose is to run the initial and final test cycles on a motor as free run test, actuated run (generator mode) magnet test and blocked shaft test. During test cycle rotation speed, noise level and multi-axial acceleration values are monitored. In addition, motor consumption and generated DC voltage are simultaneously recorded.

The second station will perform a destructive test on a batch of five motors by vibrating the motor shaft when the motor is running at nominal rotation speed. During test rotation speeds, housing temperatures are monitored.

The third station is for testing a batch of five motors under load where the force applied to the motor shaft is simulated by an inertial electromagnetic brake. The heat generated by the motors is constantly monitored and recorded on motor housing and rotor coil.

The instrumentation and interfaces in every test station are controlled by an industrial grade computer running licensed Windows 10 operating system and NI LabView software. On all stations the user can interact with the machines trough a graphical user interface having access to all functional parameters and digital readouts

Built on a lightweight porting structure this computer based test system integrates two digital cameras and a stepper motor driven and pneumatically coupled special gripper for rotating an encoder on the DUT’s dashboard.

The NI LabVIEW based software implements a digital image processing algorithm for evaluating the displayed images. A complementary algorithm controls the gripper movements simulating user interaction on the dashboard. The results are displayed after each test step was done.

The purpose of the test system is to download a firmware binary to the MCU's memory . Then it will perform further tests to check the controller's power supply, check the high and low power outputs functionality and verify if the sensor outputs and inputs are working properly. Beyond these basic test it will also perform a control panel usage simulation done by built in actuators, "robot fingers" pressing buttons and rotating encoders and also reading visual feedbacks by a multi-channel LED light analyzer.

The DUT's test points are multiplexed to a DMM by a custom developed multiplexer circuit.  The built in actuators are interfaced to the test PC system by a custom developed IO controller card.

The test system is controlled by a built in computer running an NI LabView based software featuring a complex graphical user interface for composing test recipes and displaying test result

This is done by using a known AC load resistor value and measuring the contact voltage drop.

Contact Resistance (CR) is the electrical resistance of the contacts when these are closed. The standard Contact Resistance on a relay contacts should not be greater than 100 milliohms.  To achieve accurate test results, a known test voltage and current must be applied on the test circuit using at least 1000 mA current flowing through the relay contacts. The used of an AC Power Source is required to avoid variations of the measurement caused by the AC voltage input fluctuations. It will check the controller's power supply, the high and low power outputs functionality and will verify if the sensor outputs and inputs are working properly.

The DUT's test points are multiplexed to a DMM by a custom developed multiplexer circuit.  The built in actuators are interfaced to the test PC system by a custom developed IO controller card.

The test system is controlled by a built in computer running an NI LabView based software featuring a complex graphical user interface for composing test recipes and displaying test result.

This test system validates and verifies the battery management controller in a temperature chamber. It performs various test in a simulated test environment like battery cell health check, high voltage circuit test, DC withstanding as well as insulation resistance tests on different DUT variants. The test system controls a temperature chamber capable to reach and maintain temperatures from -40°C to + 85°C and runs test sequences as prescribed temperature levels.

Most of the DUT's test points are multiplexed to a DMM by a multi-channel SMU instrument.  Other measuring circuit paths are designed with relay connections interfaced to the test PC system by a custom developed IO controller card.

The test system is controlled by a built in computer running an NI LabView based software featuring a complex graphical user interface for composing test recipes and displaying test result

Targeting user’s protections, the device uses a combination of hardware and software controls to improve safety. The Zero Crossing Turn-On design imposes the output voltage to always begin at the zero crossing of a sine wave to avoid the impact of surge voltage output; and the output voltage is automatically cut off (within 150μs) when abnormal output voltages have been detected or when the upper or lower current limits have been reached during testing. It also automatically discharges the DUT after test (within 200ms) each time to eliminate excessive voltage that remains on the DUT. The station also performs tactile test checking if DUT's screws are in place after the assembly procedure.

The test program was written in NI Labview IDE and the test steps sequencer is composed in NI TestStand IDE. The two fixture holds and contacts the different DUT variants during test. The fixture automation is controlled by an universal input-output driver and controller circuit specially developed by 3EL performing such tasks. The DUTS are identified by built in barcode readers. The whole system is controlled by an industrial PC, backed up with a powerful, industrial grade UPS unit

As part of an automated manufacturing line these multi purpose test stations are able to cover testing of different electronic control circuits. Every different type of DUT has its own instrumentation interface (junction box) implementing a golden sample DUT for self testing purposes.

The instrumentation features resistance, voltage and current measurements implemented in a SMU, HiPot tester and different power supplies.

The NI LabVIEW based software implements a CAN communication, controls the instrumentation over Ethernet and performs a more than thousand steps long test sequence

This test station will ensure that every price tag will be programmed with a firmware, will communicate over wired and wireless communication channels and will perform a visual check of displayed images with help of a human operator. The interchangeable fixture is mounted to the front panel of the instrumentation rack and connects through a special pylon contact system. Therefore a single test station is able to deserve different types of DUTs.

The test program was written in NI Labview IDE and the test steps sequencer is composed in NI TestStand IDE. The two fixtures holds and contacts the different DUT variants during test. The fixture automation is controlled by an universal input-output driver and controller circuit specially developed by 3EL performing such tasks. The DUTS are identified by built in barcode readers. The whole system is controlled by an industrial PC, backed up with a powerful, industrial grade UPS unit.

These inductors will trigger the car sunroof controller's Hall sensors in order to fulfill the test requirements. There is also implemented a proprietary designed K-line to USB transceiver circuit as the main communication interface between the sunroof controller and tester PC.

The test system is controlled by a built in computer running an NI LabView based software featuring a complex graphical user interface for composing test recipes and displaying test result.

The test system consists by two identical instrumentation rack and four dual well fixture featuring both FT and EOL testing of the two different circuit of the automotive system. Both the DC-DC converter and the supercapacitor based energy storage circuit conducts high currents during test. Software controlled, high capacity electronic loads and power supplies are used to fulfill the test requirements. The multi channel FlexRay interface is an extension of the main NI PXI system as well as the digital multimeter and DAQ interface.

The system software is built in NI LabView and TestStand featuring multithreaded, optimised hardware control of the integrated apparatus, including fixture automation functions.

This industrial grade tester device can handle 2.5kW of energy in the test circuit powering the tested DC-DC converter and evaluating its behaviour in different modes of operation.

The NI LabVIEW and TestStand based test software running on a customised NI PXI system controls a high power DC supply and electronic load connecting them to the DUT’s input and output during test steps. The currents and other work parameters are constantly monitored and recorded. During test the DUT is controlled through CAN communication messages.

The high current switching elements and signal conditioning circuits are located in a drawer integrated in the instrumentation rack

This equipment is able to download firmware in DUT's MCU and perform basic functionality test after programming is done.

The programmer (located in the fixture box) outputs are multiplexed with high speed logical circuits and linked towards a panelized DUT PCB. Desired test points of every DUTs from the PCB are linked through a digitally controlled multiplexer circuit to a digital multimeter unit and to a digitally controlled power supply. On test software commands the DMM preforms precise measurements during DUT POST and normal firmware run.

The test program was written in NI Labview IDE and the test steps sequencer is composed in NI TestStand IDE. The fixture holds and contacts the DUT during test. The fixture automation is controlled by an universal input-output driver and controller circuit specially developed by 3EL performing such tasks. The whole system is controlled by built in industrial PC

The automated production line test equipment consists of a functional and a programming cassette (fixture). Tests are performed on a multi-board PCB containing 49 pieces of IBS circuit. The programming interface is an advanced Algocraft WriteNow unit capable for multi-channel, parallel programming.

The programmer (located in the fixture box) outputs are multiplexed with high speed logical circuits and linked towards a panelized DUT PCB. Desired test points of every DUTs from the PCB are linked through a digitally controlled multiplexer circuit to a digital multimeter unit and to a digitally controlled power supply. On test software commands the DMM preforms precise measurements during DUT POST and normal firmware run.

The test program was written in NI Labview IDE and the test steps sequencer is composed in NI TestStand IDE. The fixture holds and contacts the DUT during test. The fixture automation is controlled by an universal input-output driver and controller circuit specially developed by 3EL performing such tasks. The whole system is controlled by built in industrial PC

The Boundary Scan test is based on a JT2147 QuadPOD comprising a JT2148 transceiver and four independent programmable TAP PODs (1x DIOS, 3x JT2149).
It will produce a set of tests to look for short circuit, open circuit, stuck-at and pull resistor fault based on the design information of the board tested, along with the models that have been assigned to the individual components.

Beside Boundary Scan testing the tester also performs flash memory programming sequence, uploading the given production hex files in the MCU’s flash memory and the EEPROMs; SDRAM check is also performed.

The test equipment has two main parts: rack and fixture, and a couple of affiliates like HDMI LCD monitor, keyboard and mouse. The wheeled rack contains the PDU (Power Distribution Unit), the laboratory grade, calibrated power supply and an industrial grade PC.

The FCT test determines consequent analog and digital circuit behaviors based on electrical schematic analysis and PSPICE simulation results of the given circuits. The Boundary Scan test is based on an XJLink2 XJTAG tester and software. It will produce a set of tests to look for short circuit, open circuit and pull resistor fault based on the design information of each type of board, along with the models that have been assigned to the individual components.

The final step of the Boundary Scan test is a flash memory programming sequence, uploading the given production hex file in the MCU flash memory.

The combination of functional test and embedded JTAG solutions compensates the JTAG limitation in circuit’s functionality test by using its pins for driving and measuring the PCB traces with help of external measuring equipment. Therefore, the test of an interface is very simple. The assessment of functions, which can rarely be attained during “normal operations”, can easily be tested. Furthermore, Embedded JTAG Solutions enables the fault diagnosis at pin level which is extremely useful for subsequent repair of the PCB

With integrated FEASA LED light sensor and analyzer circuit it can determine the correct color temperature and light intensity of each LED on the indicator PCB. The fixture has a complex pneumatically operated mechanical contacting plate and lid closing and opening mechanism. Equipped with power supply, digital multimeter and an industrial PC, the test station is part of the production line.

The system software is built in NI LabView featuring multithreaded, optimised hardware control of the integrated apparatus, including fixture automation functions

It can be used as part of an automated production line (inline test) or in standalone mode (offline test). This test station integrates specific apparatus performing high voltage insulation tests on assembled DUT variants. The DUT's contacts are connected by high voltage relays to the HiPot instrument during test. The fixture automation is controlled by an universal input-output driver and controller circuit specially developed by 3EL performing such tasks.

The test system is controlled by a built in computer running an NI LabView based software featuring a complex graphical user interface for monitoring the actually performed test steps and displaying test result.

In this use case every DUT variant is adapted to the measuring instruments by different, interchangeable cassettes (inserts). The product specific contacts are made inside these cassettes. Once contacted the DUTs are programmed then functionally verified.

The fixture automation is controlled by an universal input-output driver and controller circuit specially developed by 3EL performing such tasks. The DUTs are identified by a built in barcode reader.

The whole system is controlled by an industrial PC. The test program was written in NI Labview IDE and the test steps sequencer is composed in NI TestStand IDE.

Covering a diversity of DUTs in a relative small footprint and at reasonable cost were key requirements of this test station. The NI PXI systems provide high-performance modular instruments and other I/O modules that feature specialized synchronization and key software features for test and measurement applications.

The measuring and processing capabilities of this powerful system are multiplied and routed by multiplexers and other signal conditioner circuits to different DUTs and can perform individually adopted test for each type of DUT. These multiplexer and router circuits are called junction boxes. Every DUT type has assigned a proprietary junction box in the system.

Equipped with a spectrum analyzer and signal generator the system is able to generate a reference signal input for these pricetag access points and measure the output power as well the input sensitivity of the DUT's. The tests are performed in a radio frequency shielded space provided by the special built fixture case. Once the fixture lid is closed, the shielding will be complete. All DUT's contacts are transmitted over special shielded connectors to the built in instrumentation. The isolation relays are also shielded, RF type devices.

The system software is built in NI LabView featuring multithreaded, optimised hardware control of the integrated apparatus, including fixture automation functions

To performing the described tests the test station is equipped with several industrial grade instruments such programmable DC power supply, digital multimeters, digital multiplexers, as well as digital control interface circuits. To increase the productivity the system integrates a dual nest, manually operated, built in fixture. The test software handles the two nests in parallel.

The test results interpretation will help the manufacturer to verify the manufacturing line reliability and keep constant quality parameters during manufacturing processes.

The NI LabVIEW and TestStand based test software running on a customised NI PXI system controls both the instrumentation and interfaces in the station.

The user can interact with the machines through graphical user interface and physical buttons having access to all functional parameters and digital readouts